1:30 PM - 1:45 PM
[18p-G203-2] Soft Errors in Thin-BOX SOI SRAMs Exposed to Heavy Ion Radiation
Keywords:Soft error, Cosmic ray, SOI
The SOI technology is often used to develop devices with low sensitivity to soft errors. Recent technologies have a buried oxide (BOX) layer thinned down to 10 nm, and some of them have a well structure buried underneath it. This buried well structure enables us to use flexibly back bias (VB) conditioning. We recently tested such an SOI technology using radiation beams that simulate cosmic rays and found a hundredfold increase in the soft error sensitivity for a certain VB condition. We would like to share this result and discuss its physics.