Keita Nakayama

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Speaker, Author, Co-Author

Wed. Sep 18, 2019 4:00 PM - 6:00 PM PB4 (PB)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-PB4-1~12] 15.7 Crystal characterization, impurities and crystal defects

4:00 PM - 6:00 PM

[18p-PB4-9] Evaluation of SiC-SBD by multifunctional scanning probe microscope 3

〇(M1)Keita Nakayama¹, Sho Masuda¹, Nobuo Sato¹, Hidekazu Yamamoto¹ (1.Chiba Inst. of Tech.)