9:45 AM - 10:00 AM
[10a-W631-4] Defect Control by Vacuum Annealing Treatment of Ultraviolet Sensor Using CeF3 Thin Film
〇Seiya Kato1, Kentaro Suzuki1, Jun Otani1, Masahiko Kase2, Shingo Ono1 (1.Nagoya Inst., 2.USHIO INC.)
Sun. Mar 10, 2019 9:00 AM - 12:15 PM W631 (W631)
9:45 AM - 10:00 AM
〇Seiya Kato1, Kentaro Suzuki1, Jun Otani1, Masahiko Kase2, Shingo Ono1 (1.Nagoya Inst., 2.USHIO INC.)
Sat. Mar 9, 2019 1:30 PM - 3:30 PM PA1 (PA)
1:30 PM - 3:30 PM
〇Seiya Kato1, Kentaro Suzuki1, Jun Otani1, Masahiko Kase2, Shingo Ono1 (1.Nagoya Inst., 2.USHIO INC.)