The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10a-W934-1~11] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sun. Mar 10, 2019 9:00 AM - 12:00 PM W934 (W934)

Koichiro Saga(Sony), Takashi Hasunuma(Univ. of Tsukuba)

10:30 AM - 10:45 AM

[10a-W934-6] Characterizations of Electron Field Emission and Kinetic Energy of Emitted Electrons from Multiply-Stacked Structures consisting of Ge-Core Si Quantum Dots and Si Quantum Dots

〇(M2)Yuto Futamura1, Katsunori Makihara1, Akio Ohta1, Mitsuhisa Ikeda1, Seiichi Miyazaki1 (1.Nagoya Univ.)

Keywords:electron field emission, Ge core/ Si shell quantum dot, multiple stacked structures