2:15 PM - 2:30 PM
[10p-S423-4] Measurement of InP / InGaAs interfacial strain distribution by STEM Moire fringe method
Keywords:moire fringe
Presentation information
Oral presentation
Code-sharing session » 【CS.7】Code-sharing Session of 7.4 & 9.5
[10p-S423-1~13] CS.7 Code-sharing Session of 7.4 & 9.5
Sun. Mar 10, 2019 1:30 PM - 5:15 PM S423 (S423)
Takao Sasagawa(Tokyo Tech), Hideyuki Kawasoko(Tohoku Univ.), Satoshi Toyoda(Kyoto Univ.)