The 66th JSAP Spring Meeting, 2019

Presentation information

Print

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10p-W934-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Sun. Mar 10, 2019 1:30 PM - 4:45 PM W934 (W934)

Koichiro Saga(Sony), Nobuya Mori(Osaka Univ.)

2:00 PM - 2:15 PM

[10p-W934-3] Development of Non-Destructive Surface States Density Measurement by Pulse Photoconductivity Method

〇Hiroki Matsuyama1, Shotaro Kuzukawa1, Narumi Abe1, Yuki Kumagae1, Yusuke Nakayama2, Shunsuke Nakamura2, Kotaro Nagatomo2, Kazuhiro Kobayashi1, Hiroshi Kubota1, Takeshi Hashishin1, Masao Yoshioka2 (1.Graduate school of science and technology Kumamoto Univ., 2.Kumamoto Univ.)

Keywords:Interface level