[10p-W934-1~12] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[10p-W934-4] Development of Non-Destructive Surface States Density Measurement by Pulse Photoconductivity Method

〇Narumi Abe¹, Shotaro Kuzukawa¹, Hiroki Matsuyama¹, Yuki Kumagae¹, Yusuke Nakayama², Shunsuke Nakamura², Kotaro Nagatomo², Kazuhiro Kobayashi¹, Hiroshi Kubota¹, Takeshi Hashishin¹, Masao Yoshioka² (1.GSST Kumamoto Univ., 2.Kumamoto Univ.)

Keywords:semiconductor