3:00 PM - 3:15 PM
[10p-W934-6] NEGF Simulation of Inter-layer Tunneling under Finite Bias
Keywords:interlayer tunneling process, 2DTFET, simulation
Oral presentation
13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials
Sun. Mar 10, 2019 1:30 PM - 4:45 PM W934 (W934)
Koichiro Saga(Sony), Nobuya Mori(Osaka Univ.)
3:00 PM - 3:15 PM
Keywords:interlayer tunneling process, 2DTFET, simulation