The 66th JSAP Spring Meeting, 2019

Presentation information

Print

Poster presentation

13 Semiconductors » 13.3 Insulator technology

[11a-PB2-1~10] 13.3 Insulator technology

Mon. Mar 11, 2019 9:30 AM - 11:30 AM PB2 (PB)

9:30 AM - 11:30 AM

[11a-PB2-6] Determination of Density of Holes Trapped in MONOS Memories Using the Analysis of the Tunneling Current

〇Hiroshi Mino1, Kiyoteru Kobayashi1 (1.Tokai Univ.)

Keywords:MONOS memories, hole trapping characteristics, density of trapped holes