The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

13 Semiconductors » 13.3 Insulator technology

[11a-PB2-1~10] 13.3 Insulator technology

Mon. Mar 11, 2019 9:30 AM - 11:30 AM PB2 (PB)

9:30 AM - 11:30 AM

[11a-PB2-5] Defect level of nitrogen atom vacancy in hafnium-doped silicon nitride film

〇(M2)Kenya Niisato1, Kiyoteru Kobayashi1 (1.Tokai Univ.)

Keywords:sillicon nitride films