The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.1 Ferroelectric thin films

[11a-W351-1~11] 6.1 Ferroelectric thin films

Mon. Mar 11, 2019 9:00 AM - 12:00 PM W351 (W351)

Hironori Fujisawa(Univ. of Hyogo), Tomoaki Yamada(Nagoya Univ.)

11:15 AM - 11:30 AM

[11a-W351-9] Dielectric Relaxation Measurement in Polyvinylidene Difluoride Using Electrostatic Force Microscopy with Dual Bias Modulation

Yoshiomi Hiranaga1, Yasuo Cho1 (1.RIEC, Tohoku Univ.)

Keywords:probe microscopy, dielectric relaxation, PVDF