The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

15 Crystal Engineering » 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

[11p-PA4-1~13] 15.3 III-V-group epitaxial crystals, Fundamentals of epitaxy

Mon. Mar 11, 2019 1:30 PM - 3:30 PM PA4 (PA)

1:30 PM - 3:30 PM

[11p-PA4-13] GaSb thickness dependence of InAs / GaSb superlattice grown by the metalorganic chemical vapor deposition growth method analyzed by Raman scattering measurement

Taiki Aso1, Koji Maeda1, Masakazu Arai1, Yuya Yamagata1 (1.Miyazaki Univ.)

Keywords:Raman measurement, InAs/GaSb superlattice