The 66th JSAP Spring Meeting, 2019

Presentation information

Poster presentation

13 Semiconductors » 13.4 Si processing /Si based thin film / MEMS / Equipment technology

[12a-PB3-1~16] 13.4 Si processing /Si based thin film / MEMS / Equipment technology

Tue. Mar 12, 2019 9:30 AM - 11:30 AM PB3 (PB)

9:30 AM - 11:30 AM

[12a-PB3-13] Displacement detection lower limit evaluation and label-free molecular detection of optical interferometric surface stress sensor

Satoshi Maruyama1, Yong Joon Choi1, Kazuhiro Takahashi1,2, Kazuaki Sawada1 (1.Toyohashi Tech., 2.JST PRESTO)

Keywords:Fabri-Perot interferometric sensor, MEMS, antigen-antibody reaction

We report an improved minimum detectable displacement on a surface stress biosensor using optical interferometry, allowing for the detection of a low concentration of biomarker via antigen-antibody reaction. The sensor is composed of a sub-micron thickness freestanding poly methyl methacrylate/parylene-C membrane on a polydimethylsiloxane (PDMS) substrate with a micro cavity to generate optical interference. The cavity structure was fabricated by transferring the sub-micron thick bilayer to the highly adhesive PDMS. The detection of human serum albumin antigen at a concentration of 1 pg/mL was achieved by antigen-antibody reaction using simultaneous optical and electrical measurements. In addition, the minimum detectable displacement of the optical interferometric surface stress sensor was determined to be 116 pm, representing a 4.3-fold improvement compared to conventional cantilever-based surface stress sensors.