The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.2 Applications and technologies of electron beams

[9a-S223-1~9] 7.2 Applications and technologies of electron beams

Sat. Mar 9, 2019 9:30 AM - 12:00 PM S223 (S223)

Mitsunori Kitta(AIST), Takashi Kawakubo(Ntl. Intst. of Tech., Kagawa College)

9:45 AM - 10:00 AM

[9a-S223-2] Electro-plating and stripping of lead dendrites observed by operando scanning electron microscopy with an electrochemical cell

Gada He1, Yoshifumi Oshima1, Masahiko Tomitori1 (1.JAIST)

Keywords:scanning electron microscope, electrochemical cell, electro-plating and stripping

We developed a conventional electrochemical cell for scanning electron microscopy (SEM) (in-lens FE-SEM (S-5200, Hitachi)) to observe the processes of electro-plating and stripping simultaneously with measuring the cyclic voltammetry using two electrode terminals. Lead dendrites on an Au electrode in a 1.5 M Pb(NO3)2 solution in the cell were grown and decomposed during a cyclic of voltammogram. The operando SEM observation revealed that initially Pb islands formed, followed by dendritic growth. The substrate shape dependence of the process will be discussed.