[9p-PB4-1~11] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[9p-PB4-2] Penetration Depth dependence of x-ray-induced absorption intensity in silica glasses

〇Hiroki Tanaka¹, Akihiro Haruki¹, Kento Nanbo¹, Nobu Kuzuu¹, Hideharu Horikoshi² (1.Univ. of Fukui, 2.Tosoh SGM)

Keywords:silica grasses

Upon the irradiation of radiations or ultraviolet rays, absorption bands derived from the defect structure is induced in silica glasses. We have studied the optical absorption bands in silica glasses irradiated with gamma ray, X-ray, and ArF excimer lasers. X-ray is partly absorbed in the silica glass, which is different from gamma-rays or ultraviolet lights. Therefore, we measured the sample-thickness dependence of the X-ray induced absorption in silica glass.