The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

22 Joint Session M ”Phonon Engineering” » 22.1 Joint Session M "Phonon Engineering"

[9p-W371-1~16] 22.1 Joint Session M "Phonon Engineering"

Sat. Mar 9, 2019 1:45 PM - 6:15 PM W371 (W371)

Yoshiaki Nakamura(Osaka Univ.), Takanobu Watanabe(Waseda Univ.), Hiroya Ikeda(Shizuoka Univ.)

4:00 PM - 4:15 PM

[9p-W371-9] Surface potential measurements of thermoelectric materials under temperature gradient for local Seebeck coefficient mapping

Yuji Miyato1, Yuki Komatsubara1, Takafumi Ishibe1, Yoshiaki Nakamura1 (1.Osaka Unvi.)

Keywords:Thermoelectric material, Kelvin probe force microscopy, Seebeck effect

In this study, two-dimensional distributions of the thermo-induced voltages were measured on thermoelectric thin films while the horizontal temperature gradient was applied to the films, for the investigation of local Seebeck-coefficient distributions. We will report the concept of the sample holder to apply an enough temperature gradient to the sample, and the experimental results of the thermo-induced voltage distributions, measured by Kelvin probe force microscopy (KFM) known as a surface potential measurement technique.