The 81st JSAP Autumn Meeting, 2020

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[10p-Z23-1~16] 15.6 Group IV Compound Semiconductors (SiC)

Thu. Sep 10, 2020 1:15 PM - 6:00 PM Z23

Sakiko Kawanishi(Tohoku Univ.), Munetaka Noguchi(Mitsubishi Electric), Takeshi Tawara(富士電機)

1:45 PM - 2:00 PM

[10p-Z23-3] Deposition of SiC thin films using cyclic silane

Masayuki Nakamura1, Takayuki Kobayashi1, Toshiaki Tatsuta1, Shin-ichi Motoyama1 (1.Samco Inc.)

Keywords:SiC, deposition, cyclic silane

Generally, SiC thin films are deposited using silane or chloride. These are harmful to the environment and the human because of their pyrophoricity or corrosivity. Therefore, more safe precursor is demanded. In this study, we tried to deposit SiC thin films using the cyclic silane which is non-corrosive and non-pyrophoric. XRD pattern showed reflection peak at 35.6° which is indexed to 111 of β-SiC. FTIR results confirmed the presence of Si-C bond and the absence of Si-H bond.