Masanobu Hiroki

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Speaker, Author, Co-Author

Fri. Sep 23, 2022 1:30 PM - 3:45 PM B204 (B204)

Oral presentation
| 13 Semiconductors
| 13.7 Compound and power devices, process technology and characterization

[23p-B204-1~9] 13.7 Compound and power devices, process technology and characterization

3:15 PM - 3:30 PM

[23p-B204-8] Characterization of deep level traps in n-type AlN using capacitance transient measurements

〇Masanobu Hiroki¹, Yoshinori Sato¹, Yoshitaka Taniyasu¹, Kazuhide Kumakura¹ (1.NTT BRL)