The 69th JSAP Spring Meeting 2022

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13 Semiconductors » 13.7 Compound and power devices, process technology and characterization

[22a-E302-1~12] 13.7 Compound and power devices, process technology and characterization

Tue. Mar 22, 2022 9:00 AM - 12:15 PM E302 (E302)

Kozo Makiyama(Sumitomo Electric Industries, Ltd.)

9:15 AM - 9:30 AM

[22a-E302-2] 1/f noise measurement on AlGaN/GaN HEMT TLM

〇koshi Katakura1, Takuya Hoshii1, Hitoshi Wakabayashi1, Kazuo Tsutsui2, Kuniyuki Kakushima1 (1.Tokyo Tech, 2.Tokyo Tech IIR)

Keywords:1/f noise, AlGaN/GaN HEMT