The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

21 Joint Session K "Wide bandgap oxide semiconductor materials and devices" » 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[16a-E102-1~6] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Thu. Mar 16, 2023 10:30 AM - 12:00 PM E102 (Building No. 12)

Masataka Higashiwaki(NICT)

11:15 AM - 11:30 AM

[16a-E102-4] Depth profile of Nb in anatase Ti1−xNbxO2 thin films grown by mist chemical vapor deposition method

〇(D)Han XU1, Tomohito Sudare1,4, Yumie Miura1,4, Ryo Nakayama1,4, Ryota Shimizu1, Naoomi Yamada2, Kentaro Kaneko3, Taro Hitosugi1,4 (1.Tokyo Tech., 2.Chubu Univ., 3.Ritsumeikan Univ., 4.Univ. Tokyo)

Keywords:mist chemical vapor deposition, transparent conductive oxide

Niobium-doped anatase titanium dioxide (Ti1xNbxO2: TNO) has gained much attention due to its transparent conducting properties. The fabrication of TNO thin films has been mainly studied using vacuum physical vapor deposition (PVD). In this research, we applied mist chemical vapor deposition (mist-CVD), which is a high-throughput, scalable, cost-effective, and environmentally-friendly process, to fabricate TNO thin films.