We are pleased to welcome you to AIST Nanocharacterization Facility (ANCF), one of open research facilities at National Institute of Advanced Industrial Science and Technology (AIST), Japan, and to help you solve your problems with our developed analytical instruments and technologies including Positron Probe MicroAnalyzer, X-ray Absorption Fine Structure Spectroscopy with a Superconducting Fluorescence Detector, Visible/Near-Infrared Transient Absorption Spectrometer, Real Surface Probe Microscope, Solid-State Nuclear Magnetic Resonance Spectrometer, and Scanning Electron Microscope with a Superconducting Tunnel Junction X-ray Detector. They are not commercially available but only available at ANCF. With NPF at AIST, we are also active at MEXT-sponsored Advanced Research Infrastructure for Materials and Nanotechnology (ARIM) to lead DX by materials science.

産総研共用施設の「産総研先端ナノ計測施設（ANCF）」は、弊所独自開発の分析機器や技術を公開し皆様の課題解決をお手伝いします。