Divisions' Session

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

Tue. Oct 31, 2023 2:00 PM - 4:45 PM E: Room222 (2F)

Chair:Yoshimi Abe(Mitsubishi Chemical Corporation)

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2:00 PM - 2:30 PM

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging

*Hayaru Shouno¹, Akihiro Endo², Kota Sawada², Yoshiyuki Furuya², Kenji Nagata², Hideki Yoshikawa² (1. The University of Electro-Communications, 2. National Institute for Material Science)

2:30 PM - 3:00 PM

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

*Satoka Aoyagi¹ (1. Seikei University)

3:00 PM - 3:30 PM

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

*Shin Tajima¹ (1. Toyota Central R&D Labs., Inc.)

Break time (3:30 PM - 3:45 PM)

3:45 PM - 4:15 PM

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

*Hiroshi Shinotsuka¹, Kenji Nagata¹, Malinda Siriwardana¹, Hideki Yoshikawa¹, Hayaru Shouno², Masato Okada³ (1. National Institute for Materials Science, 2. The University of Electro-Communications, 3. The University of Tokyo)

4:15 PM - 4:45 PM

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

*Noriaki Sanada¹ (1. ULVAC-PHI, Inc.)

Session information

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

Authentication

Session information

[1Ep01-05] Development of Data Processing and Data Utilization in Surface Analysis: Surface Analysis Division's Session

[1Ep01] Deciphering Material Histories: EstimatingExposure Temperature and Fracture Causes through Microscopic Imaging

[1Ep02] Data analysis contribution to the interpretation of complex data by surface analysis techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its future development.

[1Ep03] Materials search method using high-throughput experimental screening and machine learning models

[1Ep04] Introduction to sample structure prediction from XPS data using Bayesian estimation and SESSA Simulator

[1Ep05] Optimization Strategies for Peak Area Measurement in Practical XPS Analysis

Authentication

[1Ep01] Deciphering Material Histories: Estimating
Exposure Temperature and Fracture Causes through Microscopic Imaging