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[1Ha01(招待講演)] Clarifying issues in solar cells by band structure using HAXPES
We investigate the potential of new materials for the carrier selective contact (CSC) layer. As a CSC layer, we focused on MoS2, a two-dimensional layered material. The carrier selectivity of MoSx for n-type Si substrates was evaluated by angle-resolved HAXPES measurements. As a result, we found that the band structure of the Si substrate is bent downward near the MoSx/n-Si interface. This indicate that MoSx has electron selectivity for n-Si substrate.
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