[1P01-52] Poster Presentation

[1P01] Development of schlieren electron microscopy for observation of electromagnetic fields

*Ken Harada¹, Keiko Shimada¹, Hiroshi Nakajima², Shigeo Mori², Yoshio Takahashi³ (1. RIKEN, 2. Osaka Metroplitan University, 3. Hitachi, Ltd.)

We have developed schlieren electron microscopy as an extension of the hollow-cone illumination methods. The advantage of the schlieren microscopy is that field emission electron beams are not needed while also making it possible to observe a wide area of electric and magnetic fields, which are difficult to observe even with electron holography.