[1P01-52] Poster Presentation

[1P33] Structural characterization of metal-organic framework thin films using infrared scattering-type scanning near-field optical microscopy

*Yukihiro Matsumoto¹, Tomoko K. Shimizu² (1. Graduate School of Science and Technology, Keio University, 2. Faculty of Science and Technology, Keio university)

Metal-organic framework (MOF) thin films have potential applications such as gas sensors and electrocatalysts, but structural details of MOF thin films remain unclear. In this study, we carried out the structural characterization of MOF monolayer and thicker films using infrared scattering-type scanning near-field optical microscopy (IR s-SNOM). We fabricated one of the MOF thin films called NAFS-1 and obtained IR s-SNOM spectra. The spectra exhibit characteristic IR peaks of the NAFS-1. Every spectrum obtained from different spots in the same sample shows almost the same characteristics, indicating nanoscale structural homogeneity of the fabricated NAFS-1 films.