[2Dp01-08] Advancement of experimental techniques for surface analysis using synchrotron radiation and its applications: Synchrotron Radiation Surface Science Division's Session

[2Dp04] In situ/Operando Chemical Imaging of Battery Materials using X-ray Spectroscopic Ptychography

*Nozomu Ishiguro¹ (1. International Center for Synchrotron Radiation Innovation Smart (SRIS), Tohoku University )

X-ray ptychography is a coherent X-ray diffractive imaging technique with the object of interest scanned in small steps by an overlapping probe. The collected diffraction pattern set is reconstructed into real-space images of the sample by iterative phase retrieval calculation with a 10 nm order spatial resolution. The spectroscopic ptychography method is a combination of X-ray ptychography imaging and XAFS spectroscopy, where X-ray ptychography measurements are applied in X-ray energy around the target absorption edge. Thus, the reconstructed image stacks of the sample objects provide highly spatially-resolved XAFS spectra of the non-uniform materials in nanoscale, which is considered to be the most promising tools for visualizing mesoscopic structures and chemical states (e.g., element composition, valence, local structures, etc.). Here, we report developed X-ray ptychography in tender X-ray regions (2.5 keV) for the first time. This technique will be a powerful tool for analyzing samples containing sulfur, phosphorus, chlorine, etc., with high spatial resolution, such as battery materials, soft materials, and biomaterials.