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[2Dp07] In situ soft-X-ray absorption spectroscopy study of selective cobalt oxidation in the cocatalyst-loaded SrTiO3:Al photocatalyst under UV irradiation
In situ observation for the Rh/Cr2O3-CoOOH-loaded STO:Al photocatalyst with Co L-edge SXAS measurements was performed using total electron yield (TEY) mode and conversion electron yield (CEY) mode. Comparing the results from TEY and CEY mode for Co L edge spectrum, CEY mode measurement enables to obtain artificial-reduction-free SXAS data. Without water vapor exposure, Co cannot accept photoexcited holes from the bulk of photocatalyst, but reduced to Co2+ under UV-Vis irradiation by showing intensity of pre-edge region increases. As water vapor was introduced to the surface of CoOOH, UV-Vis irradiation induced selective oxidation of Co in the CoOOH OER site. This provides evidence for hole transfer from the STO:Al to the OER site under photoirradiation.
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