[2P01-53] Poster Presentation

[2P15] Thermal drift complementation of scanning probe
microscopy imaging using feature point matching

Zhuo Diao¹, Keiichi Ueda^1,2, Linfeng Hou¹, Hayato Yamashita¹, Oscar Custance³, *Masayuki Abe¹ (1. Graduate School of Engineering Science, Osaka University, 2. Tokyo Metropolitan Industrial Technology Research Institute, 3. National Institute for Materials Science)

Scanning probe microscopes are used to image sample surfaces at the nano to atomic level. Until now, precise measurements were conducted under ultra-high vacuum and extreme low-temperature environments. Recently, capturing phenomena occurring at room temperature, such as surface diffusion, surface dynamics, biological observations, and drug reactions, has become important. However, at room temperature, thermal drift causes the imaging area to shift, making long-term observation of changes in the same region at the nanometer scale very challenging. In this study, we report the development of an automatic correction technique for thermal drift using feature point matching.