[3Ea01-05] Photo-related scanning probe microscopy: MHz to X-ray: Probe Microscopy Division's Session

[3Ea04] Synchrotron x-ray scanning tunneling microscopy reaches real-space characterization of just one atom

*Volker Rose¹ (1. Argonne National Laboratory, USA)

The combination of the ultimate spatial resolution of scanning tunneling microscopy with the chemical and magnetic sensitivity of synchrotron x-rays has opened the prospect for an entirely new way of nanoscale materials’ characterization. Over the last couple of years, Argonne National Laboratory has advanced the development of synchrotron x-ray scanning tunneling microscopy (SX-STM). The characterization of a single atom with chemical contrast has been achieved recently.