[SO2] short-oral session 2

[IS2-11] Intensity Increment Outliers Detector and Local Orientation Code Pattern for Robust Defect Detection in Background of SHIBO Surfaces

*Yaping YAN¹, Shun’ichi KANEKO¹, Hirokazu ASANO² (1. Hokkaido University, 2. HUAWEI Technologies Japan K.K.)

【この講演のインタラクティブセッションを見る】