The Japan Society of Applied Physics

415件中(351 - 360)

[J-6-05] Enhanced Electrical Performance and Reliability of Ti-SZTO Thin-Film Transistors with Hf1-xSixO2 Gate Dielectrics Using Co-sputtering Technique<gdiv></gdiv>

〇Chen-En Lin1, Shui-Jinn Wang1, Rong-Ming Ko2 (1. Inst. of Microelectronics, Dept. of Electrical Engineering, National Cheng Kung University(Taiwan), 2. College of Electrical Engineering and Computer Science, National Cheng Kung University(Taiwan))

2020 International Conference on Solid State Devices and Materials |2020年9月29日(火) 17:15 〜 17:30 |PDF ダウンロード

[K-10-02] Growth and scintillation properties of ternary eutectic scintillators for radiation imaging applications.

〇Yui Takizawa1, Kei Kamada1,2,3, Masao Yoshino1, Akihiro Yamaji2, Syunsuke Kurosawa1,2, Yuui Yokota1, Hiroki Sato2, Satoshi Toyoda2, Yuji Ohashi2, Takashi Hanada1, Vladimir Kochurikhin3, Akira Yoshikawa1,2,3 (1. Institute for Material Research, Tohoku University(Japan), 2. New Industry Creation Hatchery Center(Japan), 3. C&A corporation(Japan))

2020 International Conference on Solid State Devices and Materials |2020年9月30日(水) 16:15 〜 16:30 |PDF ダウンロード

415件中(351 - 360)