Topics
Materials
- Wide band-gap materials (SiC, group III-nitrides, Ga2O3, etc.)
- Group IV materials (Si, Ge, Diamond, etc.)
- III-V compounds (GaAs, InP, Diluted magnetics, etc.)
- Oxide electronic materials (TiO2, ZnO, etc.)
- Photovoltaic materials
- Nanomaterials
- Low dimensional materials (Graphene, etc.)
Topics
- Point & Extended defects
Recognition, Imaging, Physics: origin, structure, electrical, optical and magnetic properties of defects
- Crystal growth
Diagnostics, Defect generation and annihilation
- Semiconductor process / Defect control
Impurities, Gettering, etc.
- Devices
Device imaging and mapping, Degradation, Failure analysis
- Characterization
Electrical / Optical / Magnetic Characterization, Beams (X-ray, SEM, TEM, Positron), SPM (STM, AFM, etc.), New techniques
- Novel fields
AI diagnosis, Material informatics