19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors


  • Wide band-gap materials (SiC, group III-nitrides, Ga2O3, etc.)
  • Group IV materials (Si, Ge, Diamond, etc.)
  • III-V compounds (GaAs, InP, Diluted magnetics, etc.)
  • Oxide electronic materials (TiO2, ZnO, etc.)
  • Photovoltaic materials
  • Nanomaterials
  • Low dimensional materials (Graphene, etc.)

  • Point & Extended defects
Recognition, Imaging, Physics: origin, structure, electrical, optical and magnetic properties of defects
  • Crystal growth
Diagnostics, Defect generation and annihilation
  • Semiconductor process / Defect control
Impurities, Gettering, etc.
  • Devices
Device imaging and mapping, Degradation, Failure analysis
  • Characterization
Electrical / Optical / Magnetic Characterization, Beams (X-ray, SEM, TEM, Positron), SPM (STM, AFM, etc.), New techniques
  • Novel fields
AI diagnosis, Material informatics