Tu-P: Poster-1

△ [TuP-17] Evaluation of Strain-relaxation of Carbon-doped Silicon Nanowires and its Crystal Orientation Dependence using X-ray Diffraction Reciprocal Space Mapping

*Kazutoshi Yoshioka^1,2, Ichiro Hirosawa^1,3, Takeshi Watanabe⁴, Ryo Yokogawa^1,2, Atsushi Ogura^1,2 (1. Meiji University, 2. Meiji Renewable Energy Laboratories, 3. SAGA Light Source, 4. Japan Synchrotron Radiation Research Institute)