19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

Presentation information

We-1: Oxide

Oxide

We-1: Oxide

Wed. Aug 31, 2022 3:00 PM - 4:15 PM DRIP ONLINE CONFERENCE

Chair:Michal Bockowski, Nadeemullah A Mahadik

3:00 PM - 3:30 PM

[We1-1/Inv] Structural defects in beta-Ga2O3 analyzed by X-ray topography and complementary techniques

*Yongzhao Yao1, Yoshihiro Sugawara1, Koji Sato1, Daisaku Yokoe1, Hironobu Miyamoto2, Daiki Wakimoto2, Kohei Sasaki2, Akito Kuramata2, Yukari Ishikawa1 (1. Japan Fine Ceramics Center, 2. Novel Crystal Technology, Inc.)