19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

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We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

Wed. Aug 31, 2022 4:45 PM - 6:30 PM DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman, Takayoshi Shimura

4:45 PM - 5:15 PM

[We2-1/Inv] Materials Informatics for the semiconductor crystal growth

*Kentaro Kutsukake1,2 (1. RIKEN, 2. Nagoya Univ.)