19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

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We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

Wed. Aug 31, 2022 4:45 PM - 6:30 PM DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman, Takayoshi Shimura

5:30 PM - 5:45 PM

△ [We2-3] Interpretation of dislocation images in synchrotron X-ray topography using ray-tracing simulations

*Hongyu Peng1, Balaji Raghothamachar1, Michael Dudley1 (1. Stony Brook University)