19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

Presentation information

We-2: MI & Characterization

Materials informatics & Characterization

We-2: MI & Characterization

Wed. Aug 31, 2022 4:45 PM - 6:30 PM DRIP ONLINE CONFERENCE

Chair:Jean-Pierre Landesman, Takayoshi Shimura

5:45 PM - 6:00 PM

[We2-4] Identifying edge-component Burgers vector of threading dislocations in SiC crystals by birefringence imaging

*Shunta Harada1, Kenta Murayama2 (1. Nagoya University, 2. Mipox Corporation)