19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

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We-P: Poster-2

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We-P: Poster-2


✳︎Participants can view e-posters and short presentation videos anytime during Aug. 29 - Sep. 8 on the DRIP XIX website.

Wed. Aug 31, 2022 6:45 PM - 8:00 PM DRIP-Poster-ZOOM

[WeP-04] An Enhanced Trench-Filling Epitaxy of Ge on Si for Free-Space Photodetector Application

*Kota Kato1, Kazuki Motomura1, Jose A. Piedra-Lorenzana1, MOHD FAIZ BIN AMIN1, Takeshi Hizawa1, Tetsuya Nakai2, Yasuhiko Ishikawa1 (1. Toyohashi Univ. Tech., 2. SUMCO Corp.)