We-P: Poster-2

[WeP-18] Stacking Fault Expansion from an Interfacial Dislocation in a 4H-SiC PIN Diode and Its Expansion Process

*Chiharu Ota¹, Johji Nishio¹, Aoi Okada¹, Ryosuke Iijima¹ (1. Toshiba Corporation)