19th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

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Th-1: SiC-1

SiC

Th-1: SiC-1

Thu. Sep 1, 2022 3:00 PM - 4:15 PM DRIP ONLINE CONFERENCE

Chair:Hidekazu Tsuchida, Junji Senzaki

3:45 PM - 4:00 PM

[Th1-3] Extended defects in SiC: selective etching and Raman study

*Jan Weyher1, Jaime Freitas2, J. Culbertson2, Antoin Tiberi3, Grzegorz Nowak1 (1. Institute of High Pressure Physics, 2. Naval Research Laboratory, 3. Université Montpellier II)