^○Tatsumi Hattori¹, Yuichi Shimoda¹, Haruyuki Ishii¹, Yoshihiro Saito¹, Toshiyuki Nakao², Masahiro Watanabe², Yasuhiro Yoshitake¹, Keisuke Goda³ (Hitachi High-Technologies¹, Hitachi Ltd. Yokohama Research Laboratory², Univ. of Tokyo³)

2:30 PM - 2:45 PM

[17p-C13-5] Dispersion Models of Optical Constants in SWIR Band for Reflection Spectroscopic Thickness Meter of Silicon Wafers

^○Teppei Onuki¹, Ryusuke Ono¹, Shusuke Yanagimachi¹, Hirotaka Ojima¹, Jun Shimizu¹, Libo Zhou¹ (Ibaraki Univ.¹)

2:45 PM - 3:00 PM

[17p-C13-6] Transmission Wave Plane Measurement of Large Diameter Glass Plate with Talbot Interferometer

^○(PC)Tomohiro Kiire¹, Akira Ono¹, Yoshio Hayasaki¹, Toyohiko Yatagai¹, Mitsuo Takeda¹ (CORE, Utsunomiya Univ.¹)

3:00 PM - 3:15 PM

△ [17p-C13-7] Direct Observation of Wall-drag Effect by Extremely-short Temporal Coherence Dynamic Light Scattering Technique

^○Toshiharu Watarai¹, Toshiaki Iwai¹ (TUAT¹)

Break （3:15 PM - 3:30 PM）

3:30 PM - 3:45 PM

[17p-C13-8] Mueller matrix polarimeter using photoelastic modulator - Depolarization by scattering -

Shogo Ishida¹, ^○Yukitoshi Otani¹ (CORE, Utsunomiya Univ.¹)

3:45 PM - 4:00 PM

[17p-C13-9] Angle-Resolved Measurement of Diffraction Light with High Dynamic Range Optical Scatterometer

^○(PC)Tomohiro Kiire¹, Daisuke Barada^1,2, Manabu Hakko³, Kazuhiko Momoki³, Yoshio Hayasaki¹, Toyohiko Yatagai¹ (CORE, Utsunomiya Univ.¹, Grad. Sch. Eng., Utsunomiya Univ.², Canon Inc.³)

4:00 PM - 4:15 PM

[17p-C13-10] Direct voltage measurement by Pockel’s crystal

^○Masao Takahashi¹, Kin'ich Sasaki¹ (Toshiba corporation¹)

4:15 PM - 4:30 PM

[17p-C13-11] Ion-concentration measurement in water using a WGM microcavity

^○Jiro Nishimura¹, Takasumi Tanabe¹ (Keio Univ.¹)

4:30 PM - 4:45 PM

[17p-C13-12] Transmission of hologram using a POF image guide having higher core number and the investigation of reconstructed images.

^○Keisuke Nomura¹, Masayuki Yokota¹ (Shimane Univ.¹)

4:45 PM - 5:00 PM

[17p-C13-13] Precision Surface Profile Measurement using White Light Interferometry with Tilting Reference Plane

^○Shigeru Matsui¹, Yugo Onoda¹ (Hitachi High-Tech¹)

5:00 PM - 5:15 PM

[17p-C13-14] Stroboscopic Talbot Interferometry for X-ray Phase Imaging of Periodic Processes in Soft Materials

^o(D)Margie Olbinado¹, Patrik Vagovic², Wataru Yashiro², Atsushi Momose² (GSFS, University of Tokyo¹, IMRAM, Tohoku University²)

Sessions

03. Optics » 3.4 Optical measurement

[17a-P11-1~11] 3.4 Optical measurement

[17a-P11-1] Consideration of Non-Parallel Configuration Condition for Measurement of Refractive Index Distribution Using Low-Coherence Digital Holography

[17a-P11-2] Single-shot three-dimensional shape measurement by digital light-in-flight holography with a low-coherence light source

[17a-P11-3] High-resolution imaging technique using spatial difference method

[17a-P11-4] Developments of technique for evaluation of crystallization using optical birefringence of imaging system

[17a-P11-5] High-speed pulse-driven LD light source for fluorescence lifetime measurements

[17a-P11-6] Using an adjacent pulse repetition interval length as a length scale

[17a-P11-7] Measurement of birefringence of High-Reflectivity Mirrors

[17a-P11-8] Development of waveguide optical sensor using slot waveuide

▲ [17a-P11-9] Enhancement of Brillouin Scattering Signal in Pumped Erbium-Doped Optical Fiber

[17a-P11-10] Transmission type of spectroscopic Mueller matrix polarimeter for nano-structure evaluation

[17a-P11-11] Single-Shot Complex Amplitude Measurement Method Using Transport of Intensity Equation

[17p-C13-1~14] 3.4 Optical measurement

[17p-C13-1] [JSAP Young Scientist Award Speech](15 min.) Defect Inspection Technique Using Surface Plasmon Resonance

[17p-C13-2] Inspection of the inner wall of straight pipe using multiwavelength digital holography

△ [17p-C13-3] Detection of Hydrogen Gas Using a Waveguide-Mode Sensor

[17p-C13-4] Ultra-High-Speed Imaging using Space-Time Conversion for Defect Detection