The 74th JSAP Autumn Meeting,2013

Presentation information

Oral presentation

13. Semiconductors A (Silicon) » 13.6 Silicon devices / Integration technology

[19a-C8-1~12] 13.6 Silicon devices / Integration technology

Thu. Sep 19, 2013 9:00 AM - 12:15 PM C8 (TC3 2F-201)

9:30 AM - 9:45 AM

[19a-C8-3] Analysis of Multi-Trap Random Telegraph Noise Using Trap Charging History (II):Characterization of Each Individual Oxide Trap

Toshiaki Tsuchiya1, Naoyoshi Tamura2, Akihito Sakakidani2, Kenichiro Sonoda2, Masayuki Kamei2, Shinya Yamakawa2, Sumio Kuwabara2 (Shimane Univ.1, STARC2)

Keywords:RTN