[19a-C8-1~12] 13.6 Silicon devices / Integration technology

[19a-C8-3] Analysis of Multi-Trap Random Telegraph Noise Using Trap Charging History (II):Characterization of Each Individual Oxide Trap

^○Toshiaki Tsuchiya¹, Naoyoshi Tamura², Akihito Sakakidani², Kenichiro Sonoda², Masayuki Kamei², Shinya Yamakawa², Sumio Kuwabara² (Shimane Univ.¹, STARC²)

Keywords:RTN