[28p-G2-12] △Formation of Al2O3/GeOx/Ge structure Using Low-Temperature and Damage-Free Neutral-Beam Oxidation Process
Keywords:中性粒子ビーム、酸化技術、Geプロセス技術
Regular sessions(Oral presentation)
13. Semiconductors A (Silicon) » 13.3 Insulator technology
Thu. Mar 28, 2013 2:30 PM - 6:45 PM G2 (B5 1F-2102)
Keywords:中性粒子ビーム、酸化技術、Geプロセス技術