The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

13. Semiconductors A (Silicon) » 13.3 Insulator technology

[28p-G2-1~16] 13.3 Insulator technology

Thu. Mar 28, 2013 2:30 PM - 6:45 PM G2 (B5 1F-2102)

[28p-G2-6] ▲Thermal annealing effect on the quality of GeO2 film formed by radical oxidation of Ge

Woojin Song1,2, Choong Hyun Lee1,2, Tomonori Nishimura1,2, Kosuke Nagashio1,2, Akira Toriumi1,2 (The University of Tokyo1, JST-CREST2)

Keywords:Chemical shift、GeO2、annealing