The 60th JSAP Spring Meeting,2013

Presentation information

Regular sessions(Oral presentation)

15. Crystal Engineering » 15.8 Crystal evaluation, nanoimpurities and crystal defects

[29p-G16-1~21] 15.8 Crystal evaluation, nanoimpurities and crystal defects

Fri. Mar 29, 2013 1:30 PM - 7:15 PM G16 (B5 3F-2304)

[29p-G16-10] △First-Principles Analysis on Vacancy-Type Defects Introduced by Ion Implantation

Takahiro Maeta1.2, Koji Sueoka1, Koji Izunome2 (Okayama Pref. Univ.,Dept. of System Engineering1, GlobalWafers Japan Co., Ltd.2)

Keywords:第一原理、空孔型欠陥、イオン注入