[29p-PB1-1~20] 13.3 Insulator technology

[29p-PB1-18] ▲The Valence Band Offset at GeO₂/Ge Interface Determined by Charge-corrected XPS

^○Wenfeng Zhang^1,2, Tomonori Nishimura^1,2, Kosuke Nagashio^1,2, Koji Kita^1,2, Akira Toriumi^1,2 (The Univ. of Tokyo¹, JST-CREST²)

Keywords:バンドオフセット、界面