The 61st JSAP Spring Meeting, 2014

Presentation information

Poster presentation

15. Crystal Engineering » 15.6 IV-group-based compounds

[17a-PG3-1~15] 15.6 IV-group-based compounds

Mon. Mar 17, 2014 9:30 AM - 11:30 AM PG3 (G棟2階)

9:30 AM - 11:30 AM

[17a-PG3-4] Impact of sacrificial oxidation to reliability of gate oxide on step bunching

Keiichi Yamada1, Osamu Ishiyama1, Hideki Sako1, Junji Senzaki1,2, Makoto Kitabatake1 (FUPET1, AIST2)

Keywords:ゲート酸化膜,信頼性,犠牲酸化