Poster presentation
15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects
Thu. Sep 7, 2017 1:30 PM - 3:30 PM PB6 (P)
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1:30 PM - 3:30 PM
〇Kai Tadano1, Koji Sueoka2 (1.Graduate School of Engineering, Okayama Pref. Univ., 2.Okayama Pref. Univ.)
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1:30 PM - 3:30 PM
〇(M2)Hiroki Koyama1, Koji Sueoka1 (1.Okyama Pref. Univ.)
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1:30 PM - 3:30 PM
〇Hiroaki Fukuda1, Koji Sueoka2 (1.Graduate School of Engineering, Okayama Pref. Univ., 2.Okayama Pref. Univ.)
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1:30 PM - 3:30 PM
〇Eiji Kojima1, Kenta Chokawa1, Hiroki Shirakawa1, Masaaki Araidai1,2, Kenji Shiraishi1,2 (1.Nagoya University, 2.Institute of Materials and System for Sustainability)
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1:30 PM - 3:30 PM
〇Takeshi Senda1, Takashi Ishikawa1, Hiroyuki Fujimori1, Hisashi Matsumura1, Shingo Narimatsu1, Yoshiaki Abe1, Tomoyuki Horikawa1 (1.GlobalWafers Japan)
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1:30 PM - 3:30 PM
〇AKIRA KIYOI1, TADAHARU MINATO1, KATSUMI NAKAMURA1 (1.Mitsubishi Electric Corp.)
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1:30 PM - 3:30 PM
〇Yuta Sato1, Shin Oyagi1, Akihiro Hashimoto1 (1.Fukui Univ.)
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1:30 PM - 3:30 PM
〇(M1C)Yuuki Uchida1, Mizuki Nakajima1, Hidekazu Yamamoto1, Nobuo Satoh1 (1.CIT)
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1:30 PM - 3:30 PM
〇Yumiko Takahashi1, Keiichi Hirano1, Takayoshi Shimura2, Shinji Nagamachi3 (1.KEK-PF, 2.Osaka Univ., 3.Nagamachi Science Laboratory Co., Ltd.)
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1:30 PM - 3:30 PM
〇Sadaharu Jo1 (1.Aichi Gakuin Univ.)
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