The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[20p-221C-1~15] 15.6 Group IV Compound Semiconductors (SiC)

Thu. Sep 20, 2018 1:45 PM - 6:00 PM 221C (2F_Lounge1)

Shin-Ichiro Kuroki(Hiroshima Univ.), Kazuma Eto(AIST)

5:00 PM - 5:15 PM

[20p-221C-12] Development of SiC Epitaxial Reactor Cleaning Process Using Chlorine Trifluoride Gas -Evaluation of Purified Pyrolytic Carbon as Susceptor Coating Material-

Keisuke Kurashima1, Hitoshi Habuka1, Hideki Ito2, Shinichi Mitani2, Yoshinao Takahashi3 (1.Yokohama Nat. Univ., 2.NuFlare Technologies, 3.Kanto Denka Kogyo)

Keywords:chlorine trifluoride, cleaning

The fluorination of purified pyrolytic carbon film was evaluated for the application of the SiC CVD reactor cleaning. At the temperatures less than 570 ℃, the fluorination was moderate and did not deteriorate the surface morphology.